Characterization of Materials Using Scanning Electron Microscope (The effects of composition, magnification and coating material)

الملخص

Scanning Electron Microscopy (SEM) is a versatile tool used to investigate the microstructures of materials such as ceramics, polymers, and semiconductors. It is invaluable for a wide range of investigations, including microstructural development, structure–property correlations, process control, failure analysis, quality control, surface characterization, grain orientation, and elemental determination of materials. SEM is employed for both qualitative and quantitative analyses through the use of attachments such as an Energy Dispersive X-ray Spectrometer (EDX). Imaging in SEM is influenced by various factors; it depends on the type of signal used, as well as the composition and surface characteristics of the material. Imaging defects in non-conducting materials, such as charging, can be prevented by coating the sample with a conductive material (e.g., Au or Au-Pd) or by maintaining the sample chamber under variable pressure (VP) conditions. The objective of the current study is to demonstrate the principles, operation, and applications of SEM. The effects of composition, magnification, and coating materials were also investigated